- Hohe high sensitivity in the near-infrared range (NIR)
- Global Shutter Sensor with Correlated Double Sampling (CDS)
- Resolutions up to 4 megapixel
Highly efficient, long-lasting photovoltaics are a key requirement for a breakthrough in developing renewable energies. Quality controls of solar modules must therefore meet the highest demands in terms of efficient, fast and automated optical inspection. The high sensitivity in the near-infrared range (NIR) offered by the new CMOS cameras, HXC20NIR and HXC40NIR from Baumer, is a convincing answer to these challenges. Compared with the monochrome cameras available until now, the new models are twice as sensitive at a wave length of 900 nanometers and therefore master the requirements of checking solar wafers even more effectively. Therefore the cameras are even more sensitive than systems with NIR-optimized CCD sensors. These new developments are a response to industrial demand for shorter measuring times to increase throughput. The cameras are immediately available as serially manufactured products.
A resolution of 4 megapixels with a 1:1 (2048 x 2048) aspect ratio optimally qualifies the HXC40NIR to inspect square solar wafers. The desired product quality is ensured by using the electroluminescence method to check the crystal structure for defects. The high resolution enables complete modules to be inspected with fewer cameras, thereby simplifying and reducing the cost of inspection. Excellent image quality with low readout noise is ensured by the high-performance Global Shutter Sensor from CMOSIS with Correlated Double Sampling (CDS). In addition, several image formats with up to 12 bits per pixel are supported. The cameras are equipped with a flexible CameraLink® interface that permits the highest frame rates in the Base (3 taps) and Full (10 taps) modes. The robust, industrially suited design of the cameras makes them extremely reliable and an optimized thermal concept allows them to be used throughout an expanded temperature range.